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TDP1000高壓差分探頭
- 型號(hào)TDP1000
- 屬性高壓差分探頭
- 分類 TEKTRONIX 泰克 > 差分探頭
- 品牌TEKTRONIX 泰克
- 描述The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today's Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.
詳細(xì)介紹 技術(shù)資料
The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today's Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.
Key performance specifications
1 GHz and 500 MHz probe bandwidth
<1 pF differential input capacitance
1 MΩ differential input resistance
±42 v (DC + pk AC) differential input voltage
>18 dB CMRR (at 250 MHz 50X attenuation)
Key features
Outstanding electrical performance
Selectable bandwidth-limiting filters
DC reject
Versatile DUT connectivity
Small compact probe head for probing small geometry circuit elements
Straight pin, square pin, solder down, variable pitch standard accessories
Robust design for reliability
Easy to use
Connect directly to the TekProbe? interface oscilloscopes, or to TekConnect? oscilloscopes using TCA-BNC adapter
Connect directly to oscilloscopes with the TekVPI? probe interface
Easy access to scope-displayed probe menu for probe setup control and operating status information
Remote GPIB/USB probe control through the oscilloscope
AutoZero – zeros out output offset
Provides automatic units scaling and readout on the oscilloscope display
TDP1000, TDP0500
P6251
Applications
High-speed switch mode power supply design
CAN/LIN bus design
Digital design and characterization
Manufacturing engineering test
Research and development
High-voltage differential probes
The TDP1000, TDP0500, and P6251 High-voltage Differential Probes are specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI? probe interface, or TekProbe BNC Interface. These probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:
Outstanding Electrical Performance
Versatile Device-Under-Test Connectivity
Ease of Use
